Entropy Randomization in Machine Learning - Chapman & Hall/CRC Machine Learning & Pattern Recognition Series

A systematic presentation of the randomized machine learning problem: from data processing, through structuring randomized models and algorithmic procedure, to the solution of applications-relevant problems in different fields. Provides new numerical methods for random global optimization and computation of multidimensional integrals. A universal algorithm for randomized machine learning.

ISBN:	9781032306285
Publisher:	CRC Press
Imprint:	Chapman & Hall/CRC
Published date:	09 Aug 2022
DEWEY:	006.31
DEWEY edition:	23
Language:	English
Number of pages:	392
Weight:	716g
Height:	162mm
Width:	240mm
Spine width:	30mm

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